Forensics

Equipment used:

LYRA3 XM - reff

A fully PC controlled SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and optionally with Gas Injection System (GIS). Outstanding optical properties, flicker-free digital image with super clarity,...

GSR Particle cutting

Used in application TESCAN TRACE GSR

Parameters:

Cutting a GSR Particle by a FIB

Product Focus

TIMA-product_focus

The TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis,TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the TESCAN Integrated Mineral Analyzer.

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