A new High Resolution Field Emission Scanning Electron Microscope from TESCAN will be introduced at the 2013 Microscopy and Microanalysis exhibition in Indianapolis, Indiana this summer.
Brno, Czech Republic, 08.07. 2013
TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations will introduce the newest generation FESEM platform MAIA at the upcoming M&M 2013 trade show in Indianapolis, IN USA, August 4 to 8, 2013.
Element Materials Technology Laboratories have purchased three TESCAN VEGA-XMU Variable Pressure Scanning Electron Microscopes to replace existing equipment.
The microscopes, which will be placed in Element’s laboratories located in California, Michigan and Wisconsin, feature upgraded detector technology and imaging software which will enable Element’s engineers to evaluate samples and communicate results even faster. In addition, a much larger chamber size means that larger or greater quantities of samples can be evaluated and analyzed.
TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations will introduce the world´s first fully integrated Plasma source FIB-FESEM workstation at the 2012 Microscopy and Microanalysis Trade Show in Phoenix, Arizona July 30th thru August 2nd 2012.
TESCAN recorded almost 80% increase in sales in 2011 as against the previous year. In 2010, its sales revenues were around 15 million euros, while last year, the figure rose to about 28 million. TESCAN CEO Jaroslav Klima pointed out, “The company’s growth accelerated last year. The 80 % is a clear evidence of the great effort and high quality work of all TESCAN staff.”
The Newest generation FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools. The integration of so many complementary analytical tools will allow researchers to characterize complex samples and solve analytical problems rapidly.